The New X-ray Mapping: Applying the Silicon Drift Detector (SDD) for X-ray Spectrometry and Spectrum Imaging with Output Count Rates above 100 kHz
Source abstract
Abstract
Extract HTML view is not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button. Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · X-ray Spectroscopy and Fluorescence Analysis · Nuclear Physics and Applications
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