Analyzing Dislocations with Virtual Dark Field Images Reconstructed from Electron Diffraction Patterns
Source abstract
Abstract
EF Rauch, M Véron; Analyzing Dislocations with Virtual Dark Field Images Reconstructed from Electron Diffraction Patterns, Microscopy and Microanalysis, Vo
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced X-ray Imaging Techniques · Advanced Electron Microscopy Techniques and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
Reference metadata was not supplied for this record.