Dealing With Multiple Grains in TEM Lamellae Thickness for Microstructure Analysis Using Scanning Precession Electron Diffraction
Source abstract
Abstract
A Valery, E F Rauch, A Pofelski, L Clement, F Lorut; Dealing With Multiple Grains in TEM Lamellae Thickness for Microstructure Analysis Using Scanning Prec
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques · Aluminum Alloy Microstructure Properties
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
1. International Microscopy Congress Proceedings · 2014 · 3205
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3. 10.1016/j.matchar.2009.05.01110.1016/j.matchar.2009.05.011 ↗
4. 10.1016/j.matchar.2014.08.01010.1016/j.matchar.2014.08.010 ↗