Application of Aberration-Corrected Transmission Electron Microscopy to Materials Science
Source abstract
Abstract
K Urban, M Lentzen; Application of Aberration-Corrected Transmission Electron Microscopy to Materials Science, Microscopy and Microanalysis, Volume 8, Issu
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Anodic Oxide Films and Nanostructures
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
Reference metadata was not supplied for this record.