State of the First Aberration-Corrected, Monochromized 200kV FEG-TEM

Journal Article State of the First Aberration-Corrected, Monochromized 200kV FEG-TEM Get access Gerd Benner, Gerd Benner Search for other works by this author on: Oxford Academic Google Scholar Marko Matijevic, Marko Matijevic Search for other works by this author on: Oxford Academic Google Scholar Alexander Orchowski, Alexander Orchowski Corresponding author: Orchowski@leo.de Search for other works by this author on: Oxford Academic Google Scholar Bernd Schindler, Bernd Schindler LEO Elektronenmikroskopie GmbH, Carl Zeiss S-M-T AG, D-73447 Oberkochen, Germany Search for other works by this author on: Oxford Academic Google Scholar Max Haider, Max Haider Search for other works by this author on: Oxford Academic Google Scholar Peter Hartel Peter Hartel CEOS GmbH, Englerstr. 28, D-69126 Heidelberg, Germany Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 9, Issue S03, 1 September 2003, Pages 38–39, https://doi.org/10.1017/S1431927603012005 Published: 05 September 2003