journal article·2006-08

The Development of Alternative Markers for Transmission Electron Microscopy and Correlative Transmission Electon and Light Microscopies

D Meyer, R Bleher, I Kandela, J Oliver, R Albrecht

Microscopy and Microanalysis· Volume 12· Issue S02
Publisher page

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques

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References

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