Nano-scale Strain Mapping Using Advanced STEM with a Direct Electron Detector
Source abstract
Abstract
V B Ozdol, C Gammer, MC Sarahan, A M Minor; Nano-scale Strain Mapping Using Advanced STEM with a Direct Electron Detector, Microscopy and Microanalysis, Vo
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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