journal article·2000-07

Rapid and Semi-automated Method for Analysis of the Number of Atoms of Ultra-small Platinum Clusters on Carbon

J.C. Yang, S. Bradley, J.M. Gibson

Microscopy and Microanalysis· Volume 6· Issue 4
Publisher page

Abstract

Abstract Very high angle (~100 mrad) annular dark-field (HAADF) images in a dedicated scanning transmission electron microscope (STEM) can be used to quantitatively measure the number of atoms in a cluster on a support material. We have developed a computer program which will automatically find the location of the particles and then integrate the intensity to find the number of atoms per cluster. We have examined ultra-small Pt clusters on a C substrate by this novel mass-spectroscopic technique. We discovered that the Pt clusters maintain their three-dimensional shape, and are probably spherical.
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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Chemical Physics Studies · Advanced Electron Microscopy Techniques and Applications

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