DataVXMicroscopy and MicroanalysisPaper
journal article·2004-08

Materials Applications of Aberration-Corrected STEM

S. J. Pennycook, M. F. Chisholm, M. Varela, A. R. Lupini, A. Borisevich, Y. Peng, K. Van Benthem, N. Shibata, V. P. Dravid, P. Prabhumirashi, S. D. Findlay, M. P. Oxley, L. J. Allen, N. Dellby, P. D. Nellist, Z. S. Szilagyi, O. L. Krivanek

Microscopy and Microanalysis· Volume 10· Issue S03
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Source abstract

Abstract

Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques

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References

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