Time-Resolved High-Resolution Transmission Electron Microscopy Using a Piezo-Driving Specimen Holder for Atomic-Scale Mechanical Interaction
Source abstract
Abstract
Time-resolved high-resolution transmission electron microscopy at a spatial resolution of 0.2 nm and a time resolution of 1/60 sec using a piezo-driving specimen holder is reported here. Various types of atomic processes in mechanical interaction, such as contact, bonding, deformation, and fracture, in nanometer-sized gold crystallites and carbon nanotubes are demonstrated.
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Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques
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