journal article·2009-07Open access

Iterative Autofocus Algorithms for Scanning Electron Microscopy

M Rudnaya, RMM Mattheij, JML Maubach

Microscopy and Microanalysis· Volume 15· Issue S2

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Image Processing Techniques and Applications · Photoacoustic and Ultrasonic Imaging · Optical measurement and interference techniques

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References

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