Quantitative Determination of High-Frequency Voltage Attenuation in an Electric-Pulse-Excited Stroboscopic Transmission Electron Microscope
Abstract
Research context
OpenAlex topics: Surface and Thin Film Phenomena · Near-Field Optical Microscopy · Advanced Electron Microscopy Techniques and Applications
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Affiliations
TRACE EM Unit and Department of Materials Science and Engineering, City University of Hong Kong , 83 Tat Chee Avenue, Kowloon, Hong Kong SAR ,
City University of Hong Kong Matter Science Research Institute (Futian) , No. 3, Binglang Rd, Fubao Street, Futian District, Shenzhen 518048 ,
Nanomanufacturing Laboratory (NML), City University of Hong Kong Shenzhen Research Institute , 8 Yuexing 1st Road, Shenzhen Hi-tech Industrial Park, Nanshan District, Shenzhen 518057 ,
Beijing Institute of Nanoenergy and Nanosystems, Chinese Academy of Sciences , Beijing 101400 ,
Qingyuan Innovation Laboratory , Quanzhou 362801 ,
Department of Mechanical Engineering, City University of Hong Kong , 83 Tat Chee Avenue, Kowloon, Hong Kong SAR ,