journal article·2025-02-17Open access

Quantitative Determination of High-Frequency Voltage Attenuation in an Electric-Pulse-Excited Stroboscopic Transmission Electron Microscope

Feng Zhu, Wanpeng Li, Man Chun Yeung, Yuxuan Zhang, Congcong Du, Bin Lin, Qi Wang, Xiaofeng Guo, Yu-Chun Hsueh, Fu-Rong Chen, Xiaoyan Zhong

Microscopy and Microanalysis· Volume 31· Issue 1

Abstract

Abstract High-frequency electric pulse signals are often applied to stimulate functional materials in devices. To investigate the relationship between materials structure and dynamic behavior under high-frequency electric excitation, the stroboscopic imaging mode is widely used in a transmission electron microscope (TEM). From a technical point of view, it is crucial to quantitatively determine high-frequency attenuation in an electric-pulse-excited stroboscopic TEM. Here, we propose the quantitative method to evaluate the voltage attenuation by using magnification variation of defocused bright-field transmission electron microscopy images in a stroboscopic mode when applying high-frequency electric pulse signals onto a model system of two opposite tungsten tips. The negative voltage excitation possesses higher high-frequency voltage attenuation than the positive voltage excitation due to the possible nonreciprocal transmission of the triangle waves within the circuit between the biasing sample holder and the arbitrary waveform generator. Our approach of high-frequency attenuation determination provides the experimental foundation for quantitative analysis on the dynamic evolution of materials structure and functionality under electric pulse stimuli.
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Research context

OpenAlex topics: Surface and Thin Film Phenomena · Near-Field Optical Microscopy · Advanced Electron Microscopy Techniques and Applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

TRACE EM Unit and Department of Materials Science and Engineering, City University of Hong Kong , 83 Tat Chee Avenue, Kowloon, Hong Kong SAR ,

City University of Hong Kong Matter Science Research Institute (Futian) , No. 3, Binglang Rd, Fubao Street, Futian District, Shenzhen 518048 ,

Nanomanufacturing Laboratory (NML), City University of Hong Kong Shenzhen Research Institute , 8 Yuexing 1st Road, Shenzhen Hi-tech Industrial Park, Nanshan District, Shenzhen 518057 ,

Beijing Institute of Nanoenergy and Nanosystems, Chinese Academy of Sciences , Beijing 101400 ,

Qingyuan Innovation Laboratory , Quanzhou 362801 ,

Department of Mechanical Engineering, City University of Hong Kong , 83 Tat Chee Avenue, Kowloon, Hong Kong SAR ,

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