Advancing In-Situ Sample Preparation for MEMS-Based Electrical and Electro-Thermal (S)TEM Characterization
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Surface and Thin Film Phenomena · Non-Destructive Testing Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Max Planck Institute for Solid State Research , Stuttgart , Germany
Protochips Inc. , Morrisville NC , USA
References (2)
Show source-provided references
1. Srot · Microscopy and Microanalysis · 2023 · 29 · 59610.1093/micmic/ozad004 ↗
2. Protochips Webinar Series