journal article·2024-07-24

An Improved Sum Peak Removal Method for EDS Analysis

Stephen Seddio

Microscopy and Microanalysis· Volume 30· Issue Supplement_1
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Abstract

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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Non-Destructive Testing Techniques · Integrated Circuits and Semiconductor Failure Analysis

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Affiliations

Thermo Fisher Scientific , Madison, WI , USA

References (3)

Show source-provided references
1. Newbury · J Mater Sci · 2015 · 50 · 49310.1007/s10853-014-8685-2 ↗
2. Wielopolski · Nucler Insty. Methods · 1977 · 140 · 29710.1016/0029-554X(77)90298-1 ↗
3. Gardner · Nucler Insty. Methods · 1977 · 140 · 28910.1016/0029-554X(77)90297-X ↗