Using Voltage-plus-Laser Mode to Characterize the Atom-Probe Field-Evaporation Properties of a Standard Silicon Specimen
Bibliographic record
Abstract
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Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Force Microscopy Techniques and Applications · Diamond and Carbon-based Materials Research
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Affiliations
CAMECA Instruments Inc. , a Division of Ametek, Madison, WI , USA
References (6)
Show source-provided references
1. Larson · 201310.1007/978-1-4614-8721-0 ↗
2. Tsong · 199010.1017/CBO9780511599842 ↗
3. Ulfig · Microscopy and Microanalysis · 2022 · 28 · 319010.1017/S1431927622011849 ↗
4. Larson · Microscopy and Microanalysis · 2022 · 28 · 71810.1017/S1431927622003336 ↗
5. Prosa · Microscopy and Microanalysis · 2018 · 24 · 102810.1017/S1431927618005639 ↗
6. Prosa · Microscopy and Microanalysis · 2017 · 23 · 61610.1017/S1431927617003750 ↗