Progress toward Mapping Nanoscale Carrier and Structural Dynamics in Silicon using Ultrafast TEM-Electron Energy-Loss Spectroscopy

Abstract

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Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis · Force Microscopy Techniques and Applications

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Affiliations

California Institute of Technology, Division of Chemistry and Chemical Engineering , Pasadena, CA , United States

Argonne National Laboratory, Center for Nanoscale Materials , Lemont, IL , United States

References (6)