Chasing Down Leads: Imaging Conductivity Networks in a FinFET Processor

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Research context

OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Semiconductor materials and devices · Advanced Memory and Neural Computing

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Affiliations

NanoElectronic Imaging, Inc. , Los Angeles, CA , USA

E.A. Fischione Instruments Inc. , Export, PA , USA

University of California , Los Angeles (UCLA), CA , USA

References (6)