A Nondestructive Method for Probing Layer Thicknesses in Early Photographs from Micrometers to Nanometers Using SEM-based μXRF Spectrometry

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques

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Affiliations

Smithsonian Institution, Museum Conservation Institute , Suitland, MD , USA

Library of Congress, Conservation Division , Washington, DC , USA

Smithsonian Institution, National Museum of American History , Washington, D.C. , USA

References (13)