journal article·2024-07-24Open access

TEM Preparation and Characterization of a GeTe-based Phase Change Memory Device at Partial SET Mode

C S Bonifacio, Y Yu, M L Ray, M Skowronski, P Fischione

Microscopy and Microanalysis· Volume 30· Issue Supplement_1

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Phase-change materials and chalcogenides · Chalcogenide Semiconductor Thin Films · Quantum Dots Synthesis And Properties

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Affiliations

E.A. Fischione Instruments, Inc. , Export, PA , USA

Materials Science and Engineering, Carnegie Mellon University , Pittsburgh, PA , USA

References (8)

Show source-provided references
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7. Vitale · Microsc Microanal · 2022 · 28 · 64610.1017/S1431927622000344 ↗
8. Yu · J App Phys · 2023 · 133 · 133