journal article·2024-07-24Open access

Probing the Emergent Phases in Materials for Quantum Technology via Cryogenic In Situ Biasing 4D-STEM & EELS

Michele Conroy

Microscopy and Microanalysis· Volume 30· Issue Supplement_1

Abstract

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Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques

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Affiliations

Department of Materials, London Centre of Nanotechnology, Henry Royce Institute, Imperial College London , UK

References

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