Determine the Grain Structure of Poly-Silicon Using Differential Phase Contrast Imaging
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Abstract
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Research context
OpenAlex topics: Thin-Film Transistor Technologies · Force Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis
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Affiliations
Texas Instruments Inc. , Dallas, Texas , USA
References (4)
Show source-provided references
1. Gupta · Physica Scripta · 2005 · 71 · 22510.1238/Physica.Regular.071a00225 ↗
2. Corrêa · Ultramicroscopy · 2024 · 113927
3. Bosch · Microscopy and Microanalysis · 2016 · 22 · S310.1017/S1431927616002385 ↗
4. Bouckaert · The Journal of Machine Learning Research · 2010 · 11