Focused Ion Beam Milling of Soft Materials for Improved Sample Preparation
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Integrated Circuits and Semiconductor Failure Analysis · Ion-surface interactions and analysis
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Affiliations
X-ray Science Division, Argonne National Laboratory , Lemont, IL , United States
Nanoscience and Technology Argonne National Laboratory , Lemont, IL , United States
Department of Chemical and Paper Engineering, Western Michigan University , Kalamazoo, MI , United States
Walker Department of Mechanical Engineering, The University of Texas at Austin , Austin, TX , United States