Direct Quantification of Grain Boundary Space Charge Layers using Multislice Electron Ptychography

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques

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Affiliations

Department of Materials Science and Engineering, Massachusetts Institute of Technology , Cambridge, MA , United States

References (10)