Combining Scanning Nanobeam Electron Diffraction with 3D Electron Diffraction to Investigate Crystal Defects

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Materials Science and Metallurgy, University of Cambridge , Cambridge , United Kingdom

GSK , Gunnels Wood Road , Stevenage , United Kingdom

References (6)