journal article·2024-07-24Open access

Real-time Experimental 4-D STEM Using Compressive Sensing

Alex W Robinson, Jack Wells, Daniel Nicholls, Amirafshar Moshtaghpour, Angus I Kirkland, Nigel D Browning

Microscopy and Microanalysis· Volume 30· Issue Supplement_1

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Source: Not provided · Quality: missing

Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis · Electron and X-Ray Spectroscopy Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Mechanical, Materials and Aerospace Engineering, University of Liverpool , Liverpool , UK

SenseAI Innovations Ltd., Brodie Tower, University of Liverpool , Liverpool , UK

Distributed Algorithms Centre for Doctoral Training, University of Liverpool , Liverpool , UK

Correlated Imaging Group, Rosalind Franklin Institute , Oxford , UK

Department of Materials, University of Oxford , Oxford , UK

References (5)

Show source-provided references
1. Ophus · Microscopy and Microanalysis · 2019 · 25.3 · 56310.1017/S1431927619000497 ↗
2. Jannis · Ultramicroscopy · 2022 · 233 · 11342310.1016/j.ultramic.2021.113423 ↗
3. Egerton · Micron · 2004 · 35.6 · 39910.1016/j.micron.2004.02.003 ↗
4. Nicholls · Nanoscale · 2020 · 12.41 · 2124810.1039/D0NR04589F ↗
5. Robinson · 2023