Insights into Thermal Degradation of Hot Melt Pressure-Sensitive Adhesive (PSA) with Atomic Force Microscopy - Infrared Spectroscopy (AFM-IR) Analysis
Source abstract
Abstract
Hu Duan, Brian R Strohmeier, Yunli Fang; Insights into Thermal Degradation of Hot Melt Pressure-Sensitive Adhesive (PSA) with Atomic Force Microscopy - Inf
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Analytical Chemistry and Sensors · Machine Learning in Materials Science
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Affiliations
Materials Science and Characterization, Avery Dennison Corporation , Mentor, OH, United States
References (8)
Show source-provided references
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