Strategies for Standardizing EDS Measurements
Source abstract
Abstract
Journal Article Strategies for Standardizing EDS Measurements Get access Nicholas W M Ritchie Nicholas W M Ritchie National Institute of Standards and Technology, Materials Measurement Science Division, Gaithersburg, MD, USA Corresponding author: nicholas.ritchie@nist.gov Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 28, Issue S1, 1 August 2022, Pages 496–498, https://doi.org/10.1017/S143192762200263X Published: 01 August 2022
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques · Ion-surface interactions and analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
National Institute of Standards and Technology , Materials Measurement Science Division, Gaithersburg, MD, USA
References (4)
Show source-provided references
1. Taylor
2. Ritchie · Microscopy and Microanalysis · 2017 · 23 · 22010.1017/S1431927617001787 ↗
3. Ritchie · 202210.1017/S143192762200023X ↗
4. Duane · Physical Review · 1915 · 6