Applications of Environmental SEM as In Situ Surface Science Tool with Atomic Layer Sensitivity
Source abstract
Abstract
Journal Article Applications of Environmental SEM as In Situ Surface Science Tool with Atomic Layer Sensitivity Get access Marc Willinger Marc Willinger Scientific Center of Optical and Electron Microscopy (ScopeM), ETH Zürich, Zürich, Switzerland Corresponding author: willmarc@ethz.ch Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 28, Issue S1, 1 August 2022, Pages 164–165, https://doi.org/10.1017/S1431927622001556 Published: 01 August 2022
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Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis · Advanced Electron Microscopy Techniques and Applications
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Affiliations
Scientific Center of Optical and Electron Microscopy (ScopeM) , ETH Zürich, Zürich, Switzerland
References (5)
Show source-provided references
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