Chemical Bonding State Analysis with High Energy-resolution Carbon K-Emission Spectrum of Soft Materials Obtained by Soft X-ray Emission Spectrometer
Source abstract
Abstract
Masaru Takakura, Takanori Murano, Shogo Koshiya, Peter McSwiggen, Vernon Robertson; Chemical Bonding State Analysis with High Energy-resolution Carbon K-Em
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: X-ray Spectroscopy and Fluorescence Analysis · Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis
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Affiliations
SA Business Unit JEOL Ltd. 3-1-2 Musashino , Akishima, Tokyo, Japan
JEOL USA Inc. , 11 Dearborn Road, Peabody, MA, United States
References (4)
Show source-provided references
1. Terauchi · J. Electron Microscopy · 2012 · 6110.1093/jmicro/dfr076 ↗
2. Takakura · Proc. of AMAS XV · 2019 · 26
3. Tegeler · Phys. Stat. Sol · 1977 · 84 · 56110.1002/pssb.2220840219 ↗
4. Schmidt · J. Comput. Chem · 1993 · 1410.1002/jcc.540141112 ↗