journal article·2015-08Open access

Periodic Artifact Reduction in Fourier Transforms of Full Field Atomic Resolution Images

Robert Hovden, Yi Jiang, Huolin L. Xin, Lena F. Kourkoutis

Microscopy and Microanalysis· Volume 21· Issue S3

Abstract

Robert Hovden, Yi Jiang, Huolin L Xin, Lena F Kourkoutis; Periodic Artifact Reduction in Fourier Transforms of Full Field Atomic Resolution Images, Microsc
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Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electronic and Structural Properties of Oxides · Advanced Materials Characterization Techniques · Advanced Electron Microscopy Techniques and Applications

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