The novel approach to correlative microscopy using AFM-in-SEM and CPEM technology
Source abstract
Abstract
Veronika Hegrova, Josef Horak, Zdenek Novacek, Michal Pavera, Jan Neuman; The novel approach to correlative microscopy using AFM-in-SEM and CPEM technology
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Force Microscopy Techniques and Applications
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References (1)
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1. 1 Sample courtesy: Ute Heinemeyer, BASF, Ludwigshafen am Rhein, Germany.