Orientation Adjustment of Microscale Particles for Quantitative SEM-EDS Analysis
Source abstract
Abstract
Chunfei Li, Alexander Huey, Jeremy Marshall, Coleman Milligan; Orientation Adjustment of Microscale Particles for Quantitative SEM-EDS Analysis, Microscopy
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Corrosion Behavior and Inhibition · Anodic Oxide Films and Nanostructures
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
1. 2. Stevens, K. A. (1983). Surface Tilt(the direction of slant): A Neglected Psychophysical Variable (Master's thesis, Massachusetts Institute of Technology, 1983), Cambridge.10.3758/BF03202860 ↗
2. Goldstein · 2017
3. EDS Analysis of Icosahedral Quasicrystalline Thin Film in Al65Cu25Fe15 Alloy Prepared by Arc-melting