Novel thin film lift-off process for in situ TEM tensile characterization
Source abstract
Abstract
Krishna Kanth Neelisetty, Shyam Kumar CN, Ankush Kashiwar, Torsten Scherer, VS Kiran Chakravadhanula, Christian Kuebel; Novel thin film lift-off process fo
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Semiconductor materials and interfaces · Semiconductor materials and devices
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References (2)
Show source-provided references
1. Understanding the graphitization and growth of free-standing nanocrystalline graphene using in situ transmission electron microscopy10.1039/C7NR03276E ↗
2. Nanocrystalline graphene at high temperatures: insight into nanoscale processes10.1039/C9NA00055K ↗