Few-second EELS mapping with atomic-resolution
Source abstract
Abstract
Berit Goodge, Lena Kourkoutis; Few-second EELS mapping with atomic-resolution, Microscopy and Microanalysis, Volume 27, Issue S1, 1 August 2021, Pages 2704
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electronic and Structural Properties of Oxides · Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
1. Goodge · Microsc. and Microan · 2020 · S2
2. Hart · Sci. Rep · 2017 · 7 · 824310.1038/s41598-017-07709-4 ↗
3. [2] Goodge, , (2020) arXiv: 2007.09747.
4. Goodge · Microsc. and Microan · 2018 · S1