Is the Helium Ion Microscope (Ne) suitable for EBSD sample preparation?
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques · Surface and Thin Film Phenomena
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References (3)
Show source-provided references
1. Traylor · Acta Materialia · 184 · 19910.1016/j.actamat.2019.11.047 ↗
2. Mayer · MRS Bulletin · 32 · 40010.1557/mrs2007.63 ↗
3. Michael · Microsc. Microanal