journal article·2021-08Open access

Combined focused ion beam and secondary ion mass spectrometry for high resolution light element detection applied on Li-Ion batteries

Gudrun Wilhelm, Ute Golla-Schindler, Katharina Wöhrl, Christian Geisbauer, Graham Cooke, Timo Bernthaler, Gerhard Schneider

Microscopy and Microanalysis· Volume 27· Issue S1

Abstract

Gudrun Wilhelm, Ute Golla-Schindler, Katharina Wöhrl, Christian Geisbauer, Graham Cooke, Timo Bernthaler, Gerhard Schneider; Combined focused ion beam and
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced Battery Technologies Research · Advancements in Battery Materials · Extraction and Separation Processes

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (3)

Show source-provided references
1. Golla-Schindler · Micron · 2018 · 113 · 1010.1016/j.micron.2018.06.013 ↗
2. Vetter · Journal of Power Sources · 2005 · 147 · 26910.1016/j.jpowsour.2005.01.006 ↗
3. Alliata · Electrochemistry Communications · 2000 · 2 · 43610.1016/S1388-2481(00)00056-4 ↗