Extending XPS Surface Analysis with Correlative Spectroscopy and Microscopy
Source abstract
Abstract
Tim Nunney, Paul Mack, Robin Simpson, Rick Passey, Helen Oppong-Mensah, Mark Baker; Extending XPS Surface Analysis with Correlative Spectroscopy and Micros
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques · Advanced Electron Microscopy Techniques and Applications
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References (1)
Show source-provided references
1. 10.1017/S143192761100052310.1017/S1431927611000523 ↗