Correlation of Joule Heating and Electromigration-induced Mass Transport within Nanoscale Co Interconnects by In Situ STEM
Source abstract
Abstract
Brian Zutter, Matthew Mecklenburg, Ho Leung Chan, B C Regan; Correlation of Joule Heating and Electromigration-induced Mass Transport within Nanoscale Co I
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Carbon Nanotubes in Composites · Semiconductor materials and devices · Graphene research and applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (8)
Show source-provided references
1. 10.1126/science.aaa243310.1126/science.aaa2433 ↗
2. 10.1016/0040-6090(76)90008-010.1016/0040-6090(76)90008-0 ↗
3. 10.1017/S143192761901024910.1017/S1431927619010249 ↗
4. Reimer · Transmission Electron Microscopy · 2008 · 171
5. 10.1103/PhysRevApplied.9.01400510.1103/PhysRevApplied.9.014005 ↗
6. [8] This work was supported by SRC NMP 2872.001, NSF STC award DMR-1548924 (STROBE), by NSF award DMR-1611036. Data presented here were acquired at the Core Center of Excellence in Nano Imaging (CNI) at the University of Southern California.
7. [2] der Veen, V. , IEEE International Interconnect Technology Conference (2018), p. 172-174.
8. [1] Griggio, F. , IEEE International Reliability Physics Symposium (2018), p. 6E.3 1-5