Operando Scanning Electron and Microwave Microscopies in Plasmas: A Comparative Analysis
Source abstract
Abstract
Andrei Kolmakov, Alexander Tselev; Operando Scanning Electron and Microwave Microscopies in Plasmas: A Comparative Analysis, Microscopy and Microanalysis,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Characterization and Applications of Magnetic Nanoparticles · Electron and X-Ray Spectroscopy Techniques
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References (1)
Show source-provided references
1. 10.1063/1.504959210.1063/1.5049592 ↗