Silicon-standard-based Comparisons of LEAP Accuracy and Precision

The Pre-Sharpened Microtip (PSM) [1,2] is the closest thing the atom-probe community has to a reference standard. Its chemical purity, exact atomic structure/orientation, and high survivability under voltage-pulsing and laser-pulsing conditions makes it ideal for use by the manufacturer (CAMECA ) for acquisition software development, LEAP factory acceptance testing, and hardware assessment by service in the field. However, the potential for this sample to serve as an analytical standard for data quality, composition, accuracy and precision methods development, etc., has been relatively unexplored.