2D Evaluation of the Potential Difference in an InP Device by Shadow Image Distortion Method
Source abstract
Abstract
Katsuhiro Sasaki, Hirokazu Sasaki; 2D Evaluation of the Potential Difference in an InP Device by Shadow Image Distortion Method, Microscopy and Microanalys
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Semiconductor Quantum Structures and Devices · Advancements in Semiconductor Devices and Circuit Design · Quantum and electron transport phenomena
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (7)
Show source-provided references
1. Shabata · Scientific Reports · 2015 · 5
2. 10.1017/S143192761800062410.1017/S1431927618000624 ↗
3. 10.1103/RevModPhys.59.63910.1103/RevModPhys.59.639 ↗
4. [6] Takahashi, H. , ., Proc. 16th Int. Microscopy Congress (2006) p.1104.
5. 10.1017/S143192761900126010.1017/S1431927619001260 ↗
6. 10.1088/0022-3727/17/4/00310.1088/0022-3727/17/4/003 ↗
7. [4] Sasaki, K. , ., in “The Transmission Electron Microscope”, ed. M. Khan, (InTech, Rijeka) p.1.