Application of Low kV EELS to Problematic Samples
Source abstract
Abstract
Eric V Formo, Jane Y Howe, Takeshi Sunaoshi, Atsushi Muto, Jim Kilcrease, Tina Salguero; Application of Low kV EELS to Problematic Samples, Microscopy and
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques
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References (10)
Show source-provided references
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8. Brodusch · Ultramicroscopy · 2018
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10. Special thanks to Dr. Roshini Ramachandran for preparing the LaB6 sample, to Mayra Pedraza for preparing the Li4Ti5O12 sample, and to Prof. Aaron Thompson for providing the soil sample for analysis.