journal article·2019-08Open access

Application of Low kV EELS to Problematic Samples

Eric V. Formo, Jane Y. Howe, Takeshi Sunaoshi, Atsushi Muto, Jim Kilcrease, Tina Salguero

Microscopy and Microanalysis· Volume 25· Issue S2

Abstract

Eric V Formo, Jane Y Howe, Takeshi Sunaoshi, Atsushi Muto, Jim Kilcrease, Tina Salguero; Application of Low kV EELS to Problematic Samples, Microscopy and
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques

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References (10)

Show source-provided references
1. 10.1016/j.gca.2014.09.01810.1016/j.gca.2014.09.018 ↗
2. 10.1017/S143192761600387110.1017/S1431927616003871 ↗
3. 10.1016/j.jpowsour.2013.03.02210.1016/j.jpowsour.2013.03.022 ↗
4. 10.1088/0034-4885/72/1/01650210.1088/0034-4885/72/1/016502 ↗
5. 10.1021/acsaem.8b0039110.1021/acsaem.8b00391 ↗
6. 10.1017/S143192761600110010.1017/S1431927616001100 ↗
7. 10.1021/acs.est.7b0510210.1021/acs.est.7b05102 ↗
8. Brodusch · Ultramicroscopy · 2018
9. 10.1021/acs.inorgchem.7b0246010.1021/acs.inorgchem.7b02460 ↗
10. Special thanks to Dr. Roshini Ramachandran for preparing the LaB6 sample, to Mayra Pedraza for preparing the Li4Ti5O12 sample, and to Prof. Aaron Thompson for providing the soil sample for analysis.