A Workflow for Imaging 2D Materials using 4D STEM-in-SEM

Journal Article A Workflow for Imaging 2D Materials using 4D STEM-in-SEM Get access Benjamin W Caplins, Benjamin W Caplins Material Measurement Lab, National Institute of Standards and Technology, Boulder, CO, USA Corresponding author: benjamin.caplins@nist.gov Search for other works by this author on: Oxford Academic Google Scholar Ryan M White, Ryan M White Material Measurement Lab, National Institute of Standards and Technology, Boulder, CO, USA Search for other works by this author on: Oxford Academic Google Scholar Jason D Holm, Jason D Holm Material Measurement Lab, National Institute of Standards and Technology, Boulder, CO, USA Search for other works by this author on: Oxford Academic Google Scholar Robert R Keller Robert R Keller Material Measurement Lab, National Institute of Standards and Technology, Boulder, CO, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 218–219, https://doi.org/10.1017/S143192761900182X Published: 01 August 2019