journal article·2018-08Open access

Exploring the Limits of EDS Microanalysis for Rare Earth Element Analyses

Nicholas W.M. Ritchie, Heather A. Lowers

Microscopy and Microanalysis· Volume 24· Issue S1

Abstract

Nicholas WM Ritchie, Heather A Lowers; Exploring the Limits of EDS Microanalysis for Rare Earth Element Analyses, Microscopy and Microanalysis, Volume 24,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques · Ion-surface interactions and analysis

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References (4)

Show source-provided references
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4. A modification of the linear least-squares fitting method which provides continuum suppression (Ann Arbor Science Publishers) · 1977 · 241