Imaging Point Defects in Complex Oxides Using Quantitative STEM
Source abstract
Abstract
Honggyu Kim, Jack Y Zhang, Susanne Stemmer; Imaging Point Defects in Complex Oxides Using Quantitative STEM, Microscopy and Microanalysis, Volume 23, Issue
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced X-ray Imaging Techniques
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References (4)
Show source-provided references
1. 10.1038/srep1241910.1038/srep12419 ↗
2. The authors acknowledge support by the U.S. Department of Energy (Grant No. DEFG02-02ER45994).
3. 10.1103/PhysRevLett.111.26610110.1103/PhysRevLett.111.266101 ↗
4. Kim · Phys. Rev. X · 2016 · 6 · 041063