journal article·2017-07Open access

2015 NIST Workshop on Analytical Transmission Scanning Electron Microscopy

Robert R. Keller

Microscopy and Microanalysis· Volume 23· Issue S1

Abstract

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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques

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References (6)

Show source-provided references
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3. This work is a contribution of the U.S. Department of Commerce and is not subject to copyright in the United States.
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6. 10.1016/j.ultramic.2016.05.00110.1016/j.ultramic.2016.05.001 ↗