Digital Super-Resolution in EELS
Source abstract
Abstract
Sebastian Schneider, Darius Pohl, Andrew Stevens, Nigel D Browning, Kornelius Nielsch, Bernd Rellinghaus; Digital Super-Resolution in EELS, Microscopy and
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Fluorescence Microscopy Techniques · Near-Field Optical Microscopy · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
1. 10.1016/S0006-3495(86)83640-210.1016/S0006-3495(86)83640-2 ↗
2. 10.1016/j.ultramic.2008.02.00310.1016/j.ultramic.2008.02.003 ↗
3. 10.1038/366044a010.1038/366044a0 ↗
4. Borman · Midwest Symposium on Circuits and Systems · 1998 · 374