SEM/EDS Analysis of Cell Phone Cover Glass Facilitated by the Use of a Silicon Drift Detector
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Abstract
Journal Article SEM/EDS Analysis of Cell Phone Cover Glass Facilitated by the Use of a Silicon Drift Detector Get access John Konopka John Konopka Thermo Fisher Scientific, Madison, WI, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 23, Issue S1, 1 July 2017, Pages 1838–1839, https://doi.org/10.1017/S1431927617009850 Published: 04 August 2017
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Surface Roughness and Optical Measurements · Ion-surface interactions and analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (5)
Show source-provided references
1. Harrowfield · Microbeam Analysis · 1988 · 267
2. Fiori · Microbeam Analysis · 1992 · 89
3. Nucl. Instrum
4. Newbury · Materials Science and Technology · 2016 · 1017
5. Corning document: www.corning.com/gorillaglass/worldwide/en/technology/how-it-s-made.html.