journal article·2017-07Open access

Phase Identification of III-N Thin Films Grown by Molecular Beam Epitaxy and Migration Enhanced Epitaxy using Precession Electron Diffraction

Eduardo Ortega, Y. L. Casallas-Moreno, M. Lopez-Lopez, Arturo Ponce

Microscopy and Microanalysis· Volume 23· Issue S1

Abstract

Eduardo Ortega, Y L Casallas-Moreno, M Lopez-Lopez, Arturo Ponce; Phase Identification of III-N Thin Films Grown by Molecular Beam Epitaxy and Migration En
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: GaN-based semiconductor devices and materials · Semiconductor materials and devices · ZnO doping and properties

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References (4)

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1. The work was supported by SENER-CONACYT Project number 151076 and by the National Institute on Minority Health and Health Disparities of the NIH grant G12MD007591.
2. 10.1002/jemt.2242410.1002/jemt.22424 ↗
3. 10.1063/1.480964410.1063/1.4809644 ↗
4. 10.1002/pssb.20056537610.1002/pssb.200565376 ↗