Characterization of Layer Thickness and Orientation of 2D WSe2/MoS2 Heterostructures using EDS, EBSD and AFM
Source abstract
Abstract
Christian Lang, Matthew Hiscock, Kim Larsen, Jonathan Moffat, Ravi Sundaram; Characterization of Layer Thickness and Orientation of 2D WSe2/MoS2 Heterostru
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: 2D Materials and Applications · MXene and MAX Phase Materials · Graphene research and applications
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References (2)
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1. 10.1021/nn400280c10.1021/nn400280c ↗
2. Microscopy and Microanalysis · 2013 · 19 · 187210.1017/S1431927613011355 ↗